Pore size distributions in nanoporous methyl silsesquioxane films as determined by small angle x-ray scattering.

Huang, E.; Toney, M. F.; Volksen, W.; Mecerreyes, D.; Brock, P.; Kim, H. C.; Hawker, C. J.; Hedrick, J. L.; Lee, V. Y.; Magbitang, T.; Miller, R. D. and Lurio, L. B.;
Appl. Phys. Lett.
2002
81, 2232-2234.